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Conference contributions
Co-optimization of lithographic and patterning processes for improved EPE performance
Publication:
Co-optimization of lithographic and patterning processes for improved EPE performance
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maslow, Mark
;
Timoshkov, Vadim
;
Kiers, Ton
;
Jee, Tae Kwon
;
de Loijer, Peter
;
Morikita, Shinya
;
Demand, Mark
;
Metz, Andrew W
;
Okada, Soichiro
;
Kumar, Kaushik A.
;
Biesemans, Serge
;
Yaegashi, Hidetami
;
Di Lorenzo, Paolo
;
Bekaert, Joost
;
Mao, Ming
;
Beral, Christophe
;
Lariviere, Stephane
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1947
since deposited on 2021-10-24
Acq. date: 2025-12-09
Citations
Metrics
Views
1947
since deposited on 2021-10-24
Acq. date: 2025-12-09
Citations