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Variability study with CD-SEM metrology for STT-MRAM: Correlation analysis between physical dimensions and electrical property of the memory element
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2001 since deposited on 2021-10-24
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Acq. date: 2026-01-09
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2001 since deposited on 2021-10-24
1last month
Acq. date: 2026-01-09
Citations