Publication:

Experimental comparison between relaxed and strained Ge pFinFETs

Date

2017

Proceedings Paper

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Files

35586.pdf 246.6 KB

Author(s)

Oliveira, Alberto

;

Agopian, P.G.D.

;

Martino, Joao A.

;

;

;

Witters, Liesbeth

;

Collaert, Nadine

;

Metrics

1928 since deposited on 2021-10-24

Acq. date: 2025-12-11