Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Chemical mechanical polishing and planarization of Mn-based barrier/Ru liner films in Cu interconnects for advanced metallization nodes
Publication:
Chemical mechanical polishing and planarization of Mn-based barrier/Ru liner films in Cu interconnects for advanced metallization nodes
Copy permalink
Date
2017
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sagi, K.V.
;
Teugels, Lieve
;
van der Veen, Marleen
;
Struyf, Herbert
;
Babu, S.V.
Journal
ECS Journal of Solid State Science and Technology
Abstract
Description
Metrics
Views
1996
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations
Metrics
Views
1996
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations