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A global description of the base current 1/f noise of polysilicon emitter bipolar transistors before and after hot-carrier stress
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Authors
Simoen, Eddy
;
Decoutere, Stefaan
;
Claeys, Cor
;
Deferm, Ludo
Issue
9
Journal
Solid-State Electronics
Volume
42
Title
A global description of the base current 1/f noise of polysilicon emitter bipolar transistors before and after hot-carrier stress
Publication type
Journal article
Embargo date
9999-12-31
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