Publication:

Complete degradation mapping of stacked gate-all-around Si nanowire transistors considering both intrinsic and extrinsic effects

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1960 since deposited on 2021-10-24
2last month
Acq. date: 2026-02-25

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Views

1960 since deposited on 2021-10-24
2last month
Acq. date: 2026-02-25

Citations