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Complete degradation mapping of stacked gate-all-around Si nanowire transistors considering both intrinsic and extrinsic effects
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Authors
Vaisman Chasin, Adrian
;
Bury, Erik
;
Kaczer, Ben
;
Franco, Jacopo
;
Roussel, Philippe
;
Ritzenthaler, Romain
;
Mertens, Hans
;
Horiguchi, Naoto
;
Linten, Dimitri
;
Mocuta, Anda
Conference
IEEE International Electron Devices Meeting - IEDM
Title
Complete degradation mapping of stacked gate-all-around Si nanowire transistors considering both intrinsic and extrinsic effects
Publication type
Proceedings paper
Embargo date
9999-12-31
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