Publication:
Complete degradation mapping of stacked gate-all-around Si nanowire transistors considering both intrinsic and extrinsic effects
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1964 since deposited on 2021-10-24
3last month
Acq. date: 2026-04-28
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Statistics
Views
1964 since deposited on 2021-10-24
3last month
Acq. date: 2026-04-28
Citations