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Local mechanical stress induced during Ti- and Co/Ti silicidation reaction in sub-0.25 µm MOS technologies
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Local mechanical stress induced during Ti- and Co/Ti silicidation reaction in sub-0.25 µm MOS technologies
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Steegen, An
;
De Wolf, Ingrid
;
Bender, Hugo
;
Maex, Karen
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Abstract
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1974
since deposited on 2021-10-01
1
last month
Acq. date: 2025-12-18
Citations
Metrics
Views
1974
since deposited on 2021-10-01
1
last month
Acq. date: 2025-12-18
Citations