Authors

Vandevelde, Bart; Vanhee, Filip; Pissoort, Davy; Degrendele, Lieven; De Baets, Johan; Allaert, Bart; Lauwaert, Ralph; Zanon, Franco; Labie, Riet; Willems, Geert

ISSN

0026-2714

Journal

Microelectronics Reliability

Volume

74

Title

Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components

Publication type

Journal article