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Challenges on surface conditioning in 3D device architectures: triple-gate finFETs, gate-all-around lateral and vertical nanowireFETs

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1977 since deposited on 2021-10-24
3last month
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Acq. date: 2026-01-09

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1977 since deposited on 2021-10-24
3last month
2last week
Acq. date: 2026-01-09

Citations