Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Half-threshold bias Ioff reduction down to nA range of thermally and electrically stable high-performance integrated OTS selector, obtained by Se enrichment and N-doping of thin GeSe layers
Publication:
Half-threshold bias Ioff reduction down to nA range of thermally and electrically stable high-performance integrated OTS selector, obtained by Se enrichment and N-doping of thin GeSe layers
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Avasarala, Naga Sruti
;
Donadio, Gabriele Luca
;
Witters, Thomas
;
Opsomer, Karl
;
Govoreanu, Bogdan
;
Fantini, Andrea
;
Clima, Sergiu
;
Oh, Hyungrock
;
Kundu, Shreya
;
Devulder, Wouter
;
van der Veen, Marleen
;
Van Houdt, Jan
;
Heyns, Marc
;
Goux, Ludovic
;
Kar, Gouri Sankar
Journal
Abstract
Description
Metrics
Views
2032
since deposited on 2021-10-25
428
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2032
since deposited on 2021-10-25
428
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations