Publication:

Impact of substrate resistivity on the vertical leakage, breakdown, and trapping in GaN-on-Si E-Mode HEMTs

Date

2018

Journal article

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Author(s)

;

Meneghini, Matteo

;

Stoffels, Steve

;

;

Posthuma, Niels

;

Van Hove, Marleen

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

Journal

IEEE Transactions on Electron Devices

Statistics

1990 since deposited on 2021-10-25

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Acq. date: 2026-10-11