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Depth profiling intrinsically hybrid layers and organic/inorganic stacks by variable-size argon clusters: a ToF-SIMS and XPS study
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Authors
Busby, Yan
;
Noel, Celine
;
Franquet, Alexis
;
Spampinato, Valentina
;
Felten, Alexandre
;
Houssiau, Laurent
Conference
SIMS Europe 2018
Title
Depth profiling intrinsically hybrid layers and organic/inorganic stacks by variable-size argon clusters: a ToF-SIMS and XPS study
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Meeting abstract
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