Authors

Franco, Jacopo; Kaczer, Ben; Vaisman Chasin, Adrian; Bury, Erik; Linten, Dimitri

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space

Publication type

Proceedings paper

Embargo date

9999-12-31