Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

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Authors

Jiang, Rong; Zhang, En Xia; Liao, Wenjun; Liang, Chundong; Fleetwood, Daniel; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri; Mitard, Jerome; Collaert, Nadine; Sioncke, Sonja; Waldron, Niamh

ISSN

0018-9499

Issue

1

Journal

IEEE Transactions on Nuclear Science

Volume

65

Title

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Publication type

Journal article

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