Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Jiang, Rong; Zhang, En Xia; Liao, Wenjun; Liang, Chundong; Fleetwood, Daniel; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri; Mitard, Jerome; Collaert, Nadine; Sioncke, Sonja; Waldron, Niamh

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Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

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2018

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IEEE Transactions on Nuclear Science

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Acq. date: 2026-10-11

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

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