Publication:

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Date

2018

Journal article

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Author(s)

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Liang, Chundong

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Fleetwood, Daniel

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Schrimpf, Ronald

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Linten, Dimitri

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Collaert, Nadine

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Journal

IEEE Transactions on Nuclear Science

Statistics

2106 since deposited on 2021-10-25

Acq. date: 2026-07-08