Publication:

Epitaxial CVD growth of ultra-thin Si passivation layers on strained Ge fin structures

Date

2018-02

Journal article

https://doi.org/10.1149/2.0191802jss

Simple item page Full metadata Statistics

Author(s)

;

Arimura, Hiroaki

;

;

Witters, Liesbeth

;

Pourtois, Geoffrey

;

Schulze, Andreas

;

Douhard, Bastien

;

Vanherle, Wendy

;

;

Richard, Olivier

;

;

;

;

;

Collaert, Nadine

Journal

ECS Journal of Solid State Science and Technology

Statistics

1925 since deposited on 2021-10-25

Acq. date: 2026-03-01