Authors

Witvrouw, Ann; Maex, Karen; De Ceuninck, Ward; Lekens, Geert; D'Haen, Jan; De Schepper, Luc

Issue

6_8

Journal

Microelectronics Reliability

Volume

38

Title

The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements

Publication type

Journal article

Embargo date

9999-12-31