Authors

Witvrouw, Ann; Roussel, Philippe; Beyer, Gerald; Proost, Joris; Maex, Karen

Conference

Proceedings of the IEEE International Interconnect Technology Conference - IITC

Title

Incubation, time-dependent drift and saturation during Al-Si-Cu electromigration: modelling and implications for design

Publication type

Proceedings paper

Embargo date

9999-12-31