On the origin of the leakage current in p-gate AlGaN/GaN HEMTs

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Authors
Stockman, Arno; Canato, E.; Tajalli, A.; Meneghini, M.; Meneghesso, G.; Zanoni, E.; Moens, P.; Bakeroot, Benoit
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
On the origin of the leakage current in p-gate AlGaN/GaN HEMTs
Publication type
Proceedings paper
Embargo date
9999-12-31
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