Publication:

Understanding endurance in TiN/a-Si/TiOx/TiN RRAM devices

Date

2018
Proceedings Paper
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Author(s)

Subhechha, Subhali  
;
Degraeve, Robin  
;
Belmonte, Attilio  
;
Goux, Ludovic  
;
Roussel, Philippe  
;
De Meyer, Kristin  
;
Van Houdt, Jan  
;
Kar, Gouri Sankar  

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1926 since deposited on 2021-10-26
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