Understanding endurance in TiN/a-Si/TiOx/TiN RRAM devices

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Authors
Subhechha, Subhali; Degraeve, Robin; Belmonte, Attilio; Goux, Ludovic; Roussel, Philippe; De Meyer, Kristin; Van Houdt, Jan; Kar, Gouri Sankar
Conference
IEEE International Memory Workshop - IMW
Title
Understanding endurance in TiN/a-Si/TiOx/TiN RRAM devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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