Publication:

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit

Date

2018
Proceedings Paper
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Author(s)

Van Beek, Simon  
;
Roussel, Philippe  
;
O'Sullivan, Barry  
;
Degraeve, Robin  
;
Cosemans, Stefan  
;
Linten, Dimitri  
;
Kar, Gouri Sankar  

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1868 since deposited on 2021-10-26
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