Distribution function based simulations of hot-carrier degradation in nanowire FETs

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Authors
Vandemaele, Michiel; Kaczer, Ben; Stanojevic, Zlatan; Tyaginov, Stanislav; Makarov, Alexander; Vaisman Chasin, Adrian; Mertens, Hans; Linten, Dimitri; Groeseneken, Guido
Conference
International Integrated Reliability Workshop (IIRW)
Title
Distribution function based simulations of hot-carrier degradation in nanowire FETs
Publication type
Proceedings paper
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