Publication:
Detection of Failure Mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera
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1838 since deposited on 2021-10-26
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Acq. date: 2026-08-05
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Statistics
Views
1838 since deposited on 2021-10-26
1last month
1last week
Acq. date: 2026-08-05
Citations