Publication:
A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
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2010 since deposited on 2021-10-27
3last month
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Acq. date: 2026-01-12
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Views
2010 since deposited on 2021-10-27
3last month
1last week
Acq. date: 2026-01-12
Citations