Publication:
A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
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2022 since deposited on 2021-10-27
2last month
Acq. date: 2026-09-20
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Statistics
Views
2022 since deposited on 2021-10-27
2last month
Acq. date: 2026-09-20
Citations