μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate

Thumbnail
View/open
Metadata
Show full item record
Authors
Canato, E.; Masin, F.; Borga, M.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Stockman, Arno; Banerjee, A.; Moens, P.
Conference
2019 IEEE International Reliability Physics Symposium (IRPS)
Title
μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections