Authors

Hsu, Brent; Simoen, Eddy; Lin, Dennis; Stesmans, Andre; Goux, Ludovic; Delhougne, Romain; Kar, Gouri Sankar

Conference

Semiconductors, Dielectrics, and Metals for Nanoelectronics 17

Title

A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors

Publication type

Proceedings paper