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A wet chemical method for the determination of thickness of SiO2 layers below the nanometer level
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Authors
De Smedt, Frank
;
Stevens, G.
;
De Gendt, Stefan
;
Cornelissen, Ingrid
;
Arnauts, Sophia
;
Meuris, Marc
;
Heyns, Marc
;
Vinckier, Chris
Issue
5
Journal
J. Electrochem. Soc.
Volume
146
Title
A wet chemical method for the determination of thickness of SiO2 layers below the nanometer level
Publication type
Journal article
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