Authors

Padovani, Andrea; Pesic, Milan; Anik Kumar, Mondol; Blomme, Pieter; Subirats, Alexandre; Vadakupudhu Palayam, Senthil; Baten, Zunaid; Larcher, Luca; Van den Bosch, Geert

Conference

2019 IEEE International Reliability Physics Symposium - IRPS

Title

Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers

Publication type

Proceedings paper

Embargo date

9999-12-31