Publication:
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
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2148 since deposited on 2021-10-27
6last month
2last week
Acq. date: 2026-01-09
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Metrics
Views
2148 since deposited on 2021-10-27
6last month
2last week
Acq. date: 2026-01-09
Citations