Publication:
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
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2144 since deposited on 2021-10-27
3last month
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Acq. date: 2025-12-12
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Views
2144 since deposited on 2021-10-27
3last month
3last week
Acq. date: 2025-12-12
Citations