Publication:

Full (Vg,Vd) bias space modeling of hot-carrier degradation in nanowire FETs

Date

2019

Proceedings Paper

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Files

40597.pdf 1.16 MB

Author(s)

Vandemaele, Michiel

;

;

Tyaginov, Stanislav

;

Stanojevic, Zlatan

;

Makarov, Alexander

;

Vaisman Chasin, Adrian

;

;

;

Linten, Dimitri

;

Groeseneken, Guido

Statistics

1974 since deposited on 2021-10-27

Acq. date: 2026-02-28