Hot carrier degradation and time-dependent dielectric breakdown in oxides

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Authors

Groeseneken, Guido; Degraeve, Robin; Nigam, Tanya; Van den bosch, G.; Maes, Herman

Issue

1_2

Journal

Microelectronic Engineering

Volume

49

Title

Hot carrier degradation and time-dependent dielectric breakdown in oxides

Publication type

Journal article

Embargo date

9999-12-31

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