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Articles
Hot carrier degradation and time-dependent dielectric breakdown in oxides
Publication:
Hot carrier degradation and time-dependent dielectric breakdown in oxides
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Date
1999
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3439.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Nigam, Tanya
;
Van den bosch, G.
;
Maes, Herman
Journal
Microelectronic Engineering
Abstract
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1969
since deposited on 2021-10-06
1
last month
Acq. date: 2026-02-25
Citations
Statistics
Views
1969
since deposited on 2021-10-06
1
last month
Acq. date: 2026-02-25
Citations