Impact of dimensions of memory periphery FinFETs on bias temperature instability

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Author(s)

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O'Sullivan, Barry

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Dentoni Litta, Eugenio

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Ritzenthaler, Romain

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Dupuy, Emmanuel

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Machkaoutsan, Vladimir

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Benaceur-Doumaz, D.

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Ferhat Hamida, A.

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Spessot, Alessio

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Linten, Dimitri

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Horiguchi, Naoto

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

1921 since deposited on 2021-10-28

Acq. date: 2025-10-29