Impact of dimensions of memory periphery FinFETs on bias temperature instability

Metadata

Show full item record

Authors

Boubaaya, M; O'Sullivan, Barry; Djezzar, B; Franco, Jacopo; Dentoni Litta, Eugenio; Ritzenthaler, Romain; Dupuy, Emmanuel; Machkaoutsan, Vladimir; Fazan, Pierre; Kim, C.; Benaceur-Doumaz, D.; Ferhat Hamida, A.; Spessot, Alessio; Linten, Dimitri; Horiguchi, Naoto

ISSN

1530-4388

Issue

2

Journal

IEEE Transactions on Device and Materials Reliability

Volume

20

Title

Impact of dimensions of memory periphery FinFETs on bias temperature instability

Publication type

Journal article

Collections

Articles