Understanding ESD characteristics of GGNMOS in bulk FinFET technology

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Authors
Chen, Wen Chieh; Chen, Shih-Hung; Hellings, Geert; Chiarella, Thomas; Chen, Jie; Subramanian, Sujith; Siew, Yong Kong; Linten, Dimitri; Groeseneken, Guido
Conference
42nd Annual EOS/ESD Symposium 2020
Title
Understanding ESD characteristics of GGNMOS in bulk FinFET technology
Publication type
Proceedings paper
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