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A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors
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Authors
Hsu, Brent
;
Simoen, Eddy
;
Lin, Dennis
;
Stesmans, Andre
;
Goux, Ludovic
;
Delhougne, Romain
;
Carolan, Patrick
;
Bender, Hugo
;
Kar, Gouri Sankar
ISSN
2162-8769
Issue
4
Journal
ECS Journal of Solid State Science and Technology
Volume
9
Title
A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors
Publication type
Journal article
Embargo date
9999-12-31
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