Authors

Kim, Soohyun; Kim, Jungchun; Jang, Doyoung; Ritzenthaler, Romain; Parvais, Bertrand; Mitard, Jerome; Mertens, Hans; Chiarella, Thomas; Horiguchi, Naoto; Lee, Jae Woo

ISSN

2076-3417

Issue

8

Journal

Applied Sciences

Volume

10

Title

Comparison of temperature dependent carrier transport in FinFET and gate-all-Around nanowire FET

Publication type

Journal article