On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs

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Authors

Simoen, Eddy; Dierickx, Bart; De Canne, B.; Thoma, F.; Claeys, Cor

Journal

Applied Physics A

Volume

58

Title

On the gate- and drain-voltage dependence of the RTS amplitude in submicron MOSTs

Publication type

Journal article

Embargo date

9999-12-31

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