Publication:
Characterization of defect states in Mg-doped GaN-on-Si p+n diodes using Deep-Level Transient Fourier Spectroscopy
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1950 since deposited on 2021-10-28
2last month
Acq. date: 2025-12-16
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Metrics
Views
1950 since deposited on 2021-10-28
2last month
Acq. date: 2025-12-16
Citations