Authors

Lechaux, Yoann; Minj, Albert; Mechin, Laurence; Liang, Hu; Geens, Karen; Zhao, Ming; Simoen, Eddy; Guillet, Bruno

ISSN

0268-1242

Issue

2

Journal

Semiconductor Science and Technology

Volume

36

Title

Characterization of defect states in Mg-doped GaN-on-Si p+n diodes using Deep-Level Transient Fourier Spectroscopy

Publication type

Journal article