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Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices
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Authors
Marek, Juraj
;
Mikoláek, Miroslav
;
Drobnŭ, Jakub
;
Kozarik, Jozef
;
Chvála, Ale
;
Geens, Karen
;
Borga, Matteo
;
Liang, Hu
;
You, Shuzhen
;
Decoutere, Stefaan
;
Stuchlíková, Lubica
Conference
Solid State Surfaces and Interfaces 2020 (SSSI)
Title
Electrical and DLTS Characterization of Gate Interfaces in GaN-based Trench-gate semi-vertical MOS devices
Publication type
Proceedings paper
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