Publication:

Vertical III-V gate-all-around nanowire MOSFETs: Process integration and contact resistance study

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Statistics

Views

2005 since deposited on 2021-10-29
Acq. date: 2026-04-06

Citations

Statistics

Views

2005 since deposited on 2021-10-29
Acq. date: 2026-04-06

Citations