Publication:
Full quantummechanical treatment of charge leakage in MOS capacitors with ultra-thin oxide layers
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1924 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-08
Citations
Statistics
Views
1924 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-08
Citations