Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Special Series Guest Editorial: EUV Masks
Publication:
Special Series Guest Editorial: EUV Masks
Copy permalink
Date
2021
Editorial Material
https://doi.org/10.1117/1.JMM.20.3.031008
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
57.65 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Burkhardt, Martin
;
Philipsen, Vicky
Journal
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
Abstract
Description
Metrics
Downloads
189
since deposited on 2021-11-02
7
last month
2
last week
Acq. date: 2025-12-17
Views
1737
since deposited on 2021-11-02
2
last month
Acq. date: 2025-12-17
Citations
Metrics
Downloads
189
since deposited on 2021-11-02
7
last month
2
last week
Acq. date: 2025-12-17
Views
1737
since deposited on 2021-11-02
2
last month
Acq. date: 2025-12-17
Citations