Publication:

Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405209

Simple item page Full metadata Statistics

Author(s)

Van Beek, Simon

;

;

;

;

O'Sullivan, Barry J.

;

Cosemans, Stefan

;

;

Carpenter, Robert

;

Couet, Sebastien

;

Sharifi, Shamin H.

;

;

;

Journal

na

Statistics

1894 since deposited on 2021-11-02

Acq. date: 2026-02-25