Publication:

Cumulated charging mechanisms at gate processing in high-kappa first planar NMOS devices

Date

2020
Proceedings Paper
https://doi.org/10.1109/IIRW49815.2020.9312853
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Author(s)

Hiblot, Gaspard  
;
Parihar, Narendra  
;
Dupuy, Emmanuel  
;
Mannaert, Geert  
;
Baudot, Sylvain  
;
Kaczer, Ben  
;
De Heyn, Vincent  
;
Mercha, Abdelkarim  

Journal

na

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Acq. date: 2026-04-06

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