Publication:
Alleviation of Negative-Bias Temperature Instability in Si p-FinFETs With ALD W Gate-Filling Metal by Annealing Process Optimization
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Acq. date: 2026-08-08
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1665 since deposited on 2021-11-02
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666 since deposited on 2021-11-02
56last month
9last week
Acq. date: 2026-08-08
Views
1665 since deposited on 2021-11-02
Acq. date: 2026-08-07
Citations