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Single defect studies by means of random telegraph signals in submicron silicon MOSFETs
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Acq. date: 2025-10-25
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Acq. date: 2025-10-25
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1 since deposited on 2021-10-14
Acq. date: 2025-10-25
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1875 since deposited on 2021-10-14
404item.page.metrics.field.last-week
Acq. date: 2025-10-25
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