Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

Hoenicke, Philipp; Kayser, Yves; Nikolaev, Konstantin, V; Soltwisch, Victor; Scheerder, Jeroen; Fleischmann, Claudia; Siefke, Thomas; Andrle, Anna; Gwalt, Grzegorz; Siewert, Frank; Davis, Jeffrey; Huth, Martin; Veloso, Anabela; Loo, Roger; Skroblin, Dieter; Steinert, Michael; Undisz, Andreas; Rettenmayr, Markus; Beckhoff, Burkhard

doi:10.1002/smll.202105776

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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

Date

2022

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https://doi.org/10.1002/smll.202105776

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Hoenicke, Philipp

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Kayser, Yves

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Nikolaev, Konstantin, V

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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

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