Publication:

Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures

Date

2022
Journal article
https://doi.org/10.1002/smll.202105776
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Published version 2.2 MB

Author(s)

Hoenicke, Philipp
;
Kayser, Yves
;
Nikolaev, Konstantin, V
;
Soltwisch, Victor
;
Scheerder, Jeroen  
;
Fleischmann, Claudia  
;
Siefke, Thomas
;
Andrle, Anna
;
Gwalt, Grzegorz
;
Siewert, Frank
;
Davis, Jeffrey
;
Huth, Martin
;
Veloso, Anabela  
;
Loo, Roger  
;
Skroblin, Dieter
;
Steinert, Michael
;
Undisz, Andreas
;
Rettenmayr, Markus
;
Beckhoff, Burkhard

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SMALL

Abstract

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199 since deposited on 2021-12-02
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1405 since deposited on 2021-12-02
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Acq. date: 2026-01-11

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