Publication:
AlON gate dielectric and gate trench cleaning for improved relia-bility of vertical GaN MOSFET
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484 since deposited on 2021-12-03
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4last week
Acq. date: 2026-04-08
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1528 since deposited on 2021-12-03
1last month
Acq. date: 2026-04-08
Citations