Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, Tibor; Waltl, Michael

doi:10.1109/ted.2021.3117740

Publication:

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Date

2021

Journal article

https://doi.org/10.1109/ted.2021.3117740

Simple item page Full metadata Statistics

Files

Published version 2.42 MB

Author(s)

;

;

;

;

;

;

;

;

;

;

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Statistics

1638 since deposited on 2021-12-16

1last month

1last week

Acq. date: 2026-07-17

Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Views

Citations

Statistics

Views

Citations