Publication:
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
Loading...
Journal
Abstract
Description
Metrics
Downloads
882 since deposited on 2022-01-01
145last month
37last week
Acq. date: 2025-12-15
Views
2019 since deposited on 2022-01-01
3last month
Acq. date: 2025-12-15
Citations
Metrics
Downloads
882 since deposited on 2022-01-01
145last month
37last week
Acq. date: 2025-12-15
Views
2019 since deposited on 2022-01-01
3last month
Acq. date: 2025-12-15
Citations