Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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2386 since deposited on 2022-02-14
61last month
32last week
Acq. date: 2026-10-13
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1703 since deposited on 2022-02-14
4last month
1last week
Acq. date: 2026-10-13
Citations