Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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Acq. date: 2026-05-18
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Downloads
2038 since deposited on 2022-02-14
125last month
Acq. date: 2026-05-18
Views
1690 since deposited on 2022-02-14
1last month
Acq. date: 2026-05-18
Citations