Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Bury, Erik; Vaisman Chasin, Adrian; Franco, Jacopo; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido

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Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

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2022-03-27

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Vaisman Chasin, Adrian

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2055 since deposited on 2022-02-14

Acq. date: 2026-06-22

1690 since deposited on 2022-02-14

Acq. date: 2026-06-22

Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

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