Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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1426 since deposited on 2022-02-14
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Acq. date: 2026-01-09
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1682 since deposited on 2022-02-14
Acq. date: 2026-01-09
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Downloads
1426 since deposited on 2022-02-14
185last month
46last week
Acq. date: 2026-01-09
Views
1682 since deposited on 2022-02-14
Acq. date: 2026-01-09
Citations