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Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates
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Authors
Magnani, Alessandro
;
Cosnier, Thibault
;
Amirifar, Nooshin
;
Chatterjee, Urmimala
;
Zhao, Ming
;
Li, Xiangdong
;
Geens, Karen
;
Decoutere, Stefaan
DOI
10.1016/j.microrel.2021.114061
ISSN
0026-2714
Issue
na
Journal
MICROELECTRONICS RELIABILITY
Volume
118
Title
Thermal characterization of GaN lateral power HEMTs on Si, SOI, and poly-AlN substrates
Publication type
Journal article
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